18 results
F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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F-62 XRF by Simultaneous Use of K- and L-Lines of an Element
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
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- 20 May 2016, p. 180
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F-35 Comparison of Computed Absolute Fluorescence Photon Counts with Data from Fully Calibrated Beamlines and Detectors at PTB/BESSY-II
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 20 May 2016, p. 200
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F-61 Depth-Resolved Speciation of Buried Nanolayers
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 20 May 2016, p. 215
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F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 20 May 2016, p. 221
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F63 Speciation of Nitrogen Compounds in Nanoscopic Fine Aerosol Samples Using TXRF-NEXAFS and Low-Z Particle EPMA
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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F45 The Perspective of TXRF for Environmental Analysis - Invited
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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F70 Ultra-Trace Analysis and Speciation by TXRF-NEXAFS in the Soft X-ray Range—Invited
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 20 May 2016, p. 215
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F-62 Characterization of Nanoparticles with X-ray Spectrometry Under Grazing Incidence Conditions
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 20 May 2016, p. 221
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F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 20 May 2016, p. 211
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F-49 Comparison of X-ray and Mass Spectroscopy Based Analytical Methods for Detection of Organic Contamination
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 20 May 2016, p. 221
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Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS
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- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 81-86
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Characterization of Thin ZnO Films by Vacuum Ultra-Violet Reflectometry
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- MRS Online Proceedings Library Archive / Volume 1494 / 2013
- Published online by Cambridge University Press:
- 09 January 2013, pp. 65-70
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- 2013
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The Excitation of Low Z Elements by Means of a Cylindrical Graded Multilayer as a High Energy Cut-Off in Edxrf Analysis
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 119-126
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- 1995
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Toroidally Shaped Hopg Crystals as Strongly Focusing Bragg Reflectors of Characteristic X-Ray Tube Radiation for Edxrf Analysis
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- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 523-533
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- 1993
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